INL

INL – International Iberian Nanotechnology Laboratory

Contact persons:

Clivia Sotomayor-Torres

International Iberian Nanotechnology Laboratory
Avenida Mestre José Veiga s/n
4715-330 Braga
Portugal

  • Thin Film Deposition and Material Growth:
    • Molecular beam epitaxy of InSe, GaSe, In2Se3 2D materials
    • Multi-target Singulus sputtering tool for magnetic tunnel junctions and thin-film multilayers (Timaris MTM)
    • Multi-target confocal sputtering tool (Kenosistec)
    • Metallization Singulus sputtering tool for Al, TiW(N) and Al2O3 (Timaris FTM)
    • EasyTube 3000 Graphene CVD furnace system
    • SPTS MPX CVD system for oxides, oxi:nitrides and a-Si:H deposition
    • PECVD (800ºC) systems for CNT and carbon layers deposition tool (MicroSys 400 from Roth & Rau Microsystems)
    • Cu Electroplating (AMMT GmbH)
    • Atomic Layer Deposition (Beneq TFS 200)

    Etching, Ashing, and Micromachining

    • Broad Beam ion milling with SIMS end point detect (Nordiko 7500)
    • Fluorine-based reactive ion etch system for oxides / nitrides (SPTS APS)
    • Chlorine-based reactive ion etch systems for metals (SPTS ICP and SPTS C2L ICP)
    • Silicon Deep reactive ion etching system (SPTS Pegasus)
    • Plasma asher (PVA TEPLA M360)
    • TMAH / KOH Si etch tanks (AMMT GmbH)
    • Multiple fume hoods and wet benches for chemical processes (Quimipol)
    • Oxide vapour etch release system (SPTS/PRIMAXX uEtch)
    • XeF2 isotropic Si etch system (Xactic X4)
    • Supercritical CO2 point dryer (Tousimis)

    Optical and E-beam Lithography

    • E-beam lithography tool (Vistec 5200 ES 100 kV)
    • Nanoimprint Lithography (Obducat Eitre8)
    • Direct write laser lithography (Heidelberg DWL 2000)
    • Mask aligner (Karl Suss MA BA model)
    • Optical resist track (Karl Suss Gamma Cluster)
    • E-beam resist track (Karl Suss Gamma Cluster)
    • Multiple ovens, including vapour priming
    • Coater and hotplates for substrates up to 300 mm (SCS/EMS)
    • Custom and uFab (Newport) femtosecond laser based 3D microfabrication (microprinting)

    Advanced Packaging, Annealing, and Back-end Processes

    • Chemical Mechanical Planarization (Logitech ORBIS)
    • Dicing saw (Disco DAD 3500)
    • Wire Bonder / Aluminium Wedge, Pick and Place (TPT HB)
    • Wire Bonder / Gold ball bond (TPT HB)
    • Pick and place (Finetech Fineplacer Sigma)
    • Advanced desktop research printer (LP50 Roth & Rau B.V.)
    • Magnetic Annealer with field up to 2T and temperature up to 400C (TEL, MATR 2000)

    For more information: https://inl.int/services/research-core-facilities/micro-and-nanofabrication/

  • Ansys Lumerical
  • Raytracing (Zemax)
    • Conventional Transmission Electron Microscope (TEM): JEOL JEM-2100
    • Probe corrected Scanning Transmission Electron Microscope (STEM): FEI Titan ChemiSTEM
    • Double corrected TEM/STEM: FEI Titan Cubed Themis coupled with EELS, a segmented detector, a pixelated detector, a heating/biasing holder, a cryo holder, a liquid holder, a gas holder and a tomography holder.
    • Dedicated Cryo-TEM: Thermo Scientific Glacios
    • Scanning Electron Microscope (SEM)/Environmental SEM: FEI Quanta 650 FEG
    • DualBeam Focused Ion Beam (FIB)-SEM: FEI Helios NanoLab 450S
    • X-Ray Photoelectron Spectrometer: Thermo Scientific Escalab 250Xi
    • Full-equipped sample preparation laboratory

    More information: https://inl.int/wp-content/uploads/2024/01/INL_BROCHURES_AEMIS.pdf

     

    Metrology, Inspection, and Wafer-Scale Device Testing

    • High-resolution SEM (NanoSEM, FEI)
    • Contact profilometer (KLA TENCOR P-16+)
    • Resistivity mapper (AITCO)
    • Optical profilometer/ellipsometer (OPM hyperion with confocal sensor / Ocean Optics NanoCalc XR)
    • Multiple automated wafer probers for electrical testing and others
    • Radio Frequency Electrical Characterization Laboratory (up to 40Ghz in frequency domain and 20GHz in time domain)
    • Manual and motorized optical microscopes for Automatic Optical Inspection

    Advanced multispectral microscopy setups:

    • Custom developed Optical Decetected Magnetic Resonance (ODMR setups for quantum metrology) in widefield and confocal microscopes
    • Fluorescence Lifetime Imaging (FLIM) microscopy setups
    • Nonlinear SHG and MP-FLIM microscopy
    • Streak imaging (spectral temporal characetrization)