ENSICAEN

ENSICAEN – National Graduate School of Engineering of Caen

Contact persons:

Bogdan Cretu

ENSICAEN, 6, boulevard Maréchal Juin
CS 45053 – 14050 Caen cedex 4

  • Pulsed Laser Deposition (PLD), Sputtering, Ion Beam Deposition (IBD), Ion Beam Etching (IBE), Reactive Ion Etching (RIE), UV Lithography
  • Clean room ISO6
  • Atomic Force Microscopy (AFM), mechanical profilometer; digital holographic microscope
  • Lakeshore TTP4 prober (10K – 475K) (on wafer (2inch) measurements at variable temperature)
  • Lakeshore TTP4 prober (10K – 475K) – on wafer (1 inch) measurements at variable temperature and under magnetic field
  • HP4156B semiconductor parameter analyser
  • HP3562A spectral analyzer
  • Noise home-made set-up’s, NOISYS.7 low frequency noise system.
  • Pulsed measurements, R(T) measurements and Raman Spectroscopy
  • Deep Level Transient Spectroscopy DLTS
  • Local probe microscopy (AFM, KPFM, PFM, MFM), magneto-optical Kerr (MOKE), Digital Holographic Microscope (DHM), Optical Beam Induced Resistance Change (OBIRCH) analysis (PHEMOS-1000).
  • Magnetic shielded room;
  • Dedicated characterisation set-up for sensors (magnetic, radiation, electrical, gas sensors)